The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2008

Filed:

Apr. 13, 2005
Applicant:

William A. Worstell, Wayland, MA (US);

Inventor:

William A. Worstell, Wayland, MA (US);

Assignee:

PhotoDetection Systems, Inc., Boxborough, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/163 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image-reconstruction method in which interactions with particular crystal pairs are detected and a trans-axial component of a geometric system response matrix is retrieved from a storage medium. This component provides an estimate of an axial component of the geometric system response matrix. At least in part on the basis of the axial component and the trans-axial component, an annihilation site distribution of annihilations most likely to have resulted in the interaction with the particular crystal pair is estimated.


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