The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7332284 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 19, 2008

Filed:

May. 16, 2005
Applicant:

Kuniaki Nagayama, Aichi Prefecture, JP;

Inventor:

Kuniaki Nagayama, Aichi Prefecture, JP;

Assignee:

Nagayama IP Holdings LLC, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12M 1/34 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Novel DNA sequence determination method and DNA sequencer system providing a sequencing speed 10to 10times faster than the current DNA sequencing speed (10bases per day with a lane at maximum) of the existing DNA sequencer based on electrophoresis. The method includes the step of discriminating base-specific labels of heavy elements using a magnified image of elongated single-chain DNA or RNA produced by a transmission electron microscope (TEM). The DNA sequencer system uses this method. The invention provides a DNA sequencing speed that is higher than the existing speed by 3 or 4 orders of magnitude.


Find Patent Forward Citations

Nagayama, Kuniaki. (2008). Method of determining base sequence of dna or rna using heavy element labeling and imaging by transmission electron microscopy (U.S. Patent No. 7332284). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7332284

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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