The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2008

Filed:

Jul. 07, 2005
Applicants:

Shai Fine, Ra'anana, IL;

Ari Freund, Haifa, IL;

Itai Jaeger, Lavon, IL;

Yehuda Naveh, Haifa, IL;

Avi Ziv, Haifa, IL;

Inventors:

Shai Fine, Ra'anana, IL;

Ari Freund, Haifa, IL;

Itai Jaeger, Lavon, IL;

Yehuda Naveh, Haifa, IL;

Avi Ziv, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Test generation is improved by learning the relationship between an initial state vector for a stimuli generator and generation success. A stimuli generator for a design-under-verification is provided with information about the success probabilities of potential assignments to an initial state bit vector. Selection of initial states according to the success probabilities ensures a higher success rate than would be achieved without this knowledge. The approach for obtaining an initial state bit vector employs a CSP solver. A learning system is directed to model the behavior of possible initial state assignments. The learning system develops the structure and parameters of a Bayesian network that describes the relation between the initial state and generation success.


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