The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2008
Filed:
Oct. 02, 2006
Chi-ho Hsu, Kinmen County, TW;
Chi-Ho Hsu, Kinmen County, TW;
Holtek Semiconductor Inc., Hsinchu, TW;
Abstract
A method for calibrating a parameter of an IC, using an external device so as to calibrate an analog control parameter of an internal analog circuit in the IC. The external device is used in a detecting mode so as to detect whether the analog control parameter is beyond a pre-determined range. If the analog control parameter is beyond the pre-determined range, the external device is used in a calibrating mode so as to obtain a calibrated value and the calibrated value is then written into the internal analog circuit in the IC. The external device is used for detection and calibration repeatedly until the analog control parameter is within the pre-determined range. When the analog control parameter is within the pre-determined range, the calibrated value is written into a non-volatile memory in the IC.