The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2008

Filed:

Nov. 04, 2004
Applicants:

Xueli Wang, Beijing, CN;

Xiongwei Yan, Beijing, CN;

Wei Ding, Beijing, CN;

Makoto Gohno, Tokyo, JP;

Inventors:

Xueli Wang, Beijing, CN;

Xiongwei Yan, Beijing, CN;

Wei Ding, Beijing, CN;

Makoto Gohno, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/56 (2006.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of measuring a modulation transfer function (MTF) includes detecting the center of a line spread function (LSF) image in order to calculate an MTF. For this purpose, an enlarged image of a portion of an image containing the LSF image is created, and binary-coded based on a threshold. A morphological operation is performed on the binary-coded image. Coordinates representing points that define the contour of the resultant image are sampled, and used to work out coordinates representing the center of a circle through Hough transform. The coordinates representing the center are transformed into coordinates representing a point in an original image.


Find Patent Forward Citations

Loading…