The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2008

Filed:

Jul. 19, 2004
Applicants:

Zohar H. Yakhini, Zikhron Ya'acov, IL;

Cynthia Y. Enderwick, San Jose, CA (US);

Glenda C. Delenstarr, Belmont, CA (US);

Paul K. Wolber, Los Altos, CA (US);

Nicholas M. Sampas, San Jose, CA (US);

Inventors:

Zohar H. Yakhini, Zikhron Ya'acov, IL;

Cynthia Y. Enderwick, San Jose, CA (US);

Glenda C. Delenstarr, Belmont, CA (US);

Paul K. Wolber, Los Altos, CA (US);

Nicholas M. Sampas, San Jose, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for evaluating an orientation of a molecular array having features arranged in a pattern. An image of the molecular array is obtained by scanning the molecular array to determine data signals emanating from discrete positions on a surface of the molecular array. An actual result of a function on pixels of the image which pixels lie in a second pattern, is calculated. This actual result is compared with an expected result which would be obtained if the second pattern had a predetermined orientation on the array. Array orientation can then be evaluated based on the result.


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