The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2008

Filed:

Sep. 17, 2004
Applicants:

Jin Hung Lee, Menlo Park, CA (US);

Brad Osgood, Stanford, CA (US);

Dwight G. Nishimura, Palo Alto, CA (US);

Inventors:

Jin Hung Lee, Menlo Park, CA (US);

Brad Osgood, Stanford, CA (US);

Dwight G. Nishimura, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optimal sampling pattern for variable density sampling of a continuous signal uses a statistical knowledge of the signal to determine an autocorrelation matrix from which a basis set is identified. Sampling is performed at locations determined from an eigenvector matrix, and the sampled output provides coefficients for the basis set. The reconstructed signal output is a summation of the multiplication of the coefficients and the basis set.


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