The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2008
Filed:
Apr. 02, 2001
Hyun-doo Shin, Seongnam, KR;
Yang-lim Choi, Suwon, KR;
Hyun-doo Shin, Seongnam, KR;
Yang-lim Choi, Suwon, KR;
Samsung Electronics Co., Ltd., Suwon, KR;
Abstract
A method for describing pattern repetitiveness which may exist within an image, is provided. The method of describing pattern repetitiveness of an image comprises: (a) projecting an image on a predetermined axis having a predetermined direction, (b) decomposing the projected image down one level, (c) increasing a threshold value while a pattern quantizing value is retained, and denoising the decomposed data, and (d) describing pattern repetitiveness of the image using the pattern quantizing value of the denoised data and the threshold value used for denoising. Because the method of describing pattern repetitiveness of an image effectively denoises the original image without damaging the pattern repetitiveness of the original image, and the pattern repetitiveness is described using the denoised data, it is possible to describe more definite pattern repetitiveness.