The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2008
Filed:
Jul. 30, 2004
Toshihiro Rifu, Saitama, JP;
Toshihiro Rifu, Saitama, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Medical Systems Corporation, Tochigi Ken, JP;
Abstract
Three-dimensionally reconstructed images are not ideal due to blur or smear that is caused by various sources in an X-ray CT scanner. In order to substantially minimize the blur in the three-dimensionally reconstructed image, a known PSF is weighed according to a combination of predetermined parameters. The parameters include two types of information. One group of the parameters is related to device characteristics of the scanner device while the other is related to the scanning conditions of a particular scan. The improvement is performed in any combination of the X, Y and Z directions. The improved PSF's are used to de-convolute the three-dimensionally reconstructed CT image. As a result, the blur and smear are substantially removed from the three-dimensionally reconstructed image data for good visualization as well as accurate physical measurements in the scanned image. The improved techniques according to the current invention are applicable to two-dimensional image data.