The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2008
Filed:
Feb. 25, 2003
Applicants:
Kazuhiro Fukui, Yokohama, JP;
Osamu Yamaguchi, Yokohama, JP;
Inventors:
Kazuhiro Fukui, Yokohama, JP;
Osamu Yamaguchi, Yokohama, JP;
Assignee:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention solves an eigenvalue problem using a sum of projection matrixes for each subspace. A space which is spanned by a plurality of eigenvectors which are selected starting from those having a smaller eigenvalue is used as a constraint subspace.
Fukui, Kazuhiro. (2008). Apparatus for generating a pattern recognition dictionary, a method thereof, a pattern recognition apparatus and a method thereof (U.S. Patent No. 7330591). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7330591
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile