The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2008
Filed:
Aug. 19, 2002
Bernard T. Clark, Los Gatos, CA (US);
David L. Freeman, Los Gatos, CA (US);
Jeffrey A. Hawthorne, Unionville, CA;
Alexander J. Nagy, Santa Cruz, CA (US);
William K. Pratt, Los Altos, CA (US);
Bernard T. Clark, Los Gatos, CA (US);
David L. Freeman, Los Gatos, CA (US);
Jeffrey A. Hawthorne, Unionville, CA;
Alexander J. Nagy, Santa Cruz, CA (US);
William K. Pratt, Los Altos, CA (US);
Photon Dynamics, Inc., San Jose, CA (US);
Abstract
Integrated inspection and test systems for liquid crystal display (LCD) active plates. The integrated inspection and test systems may combine visual imaging inspection and an electronic sensing such as voltage imaging, electron beam sensing or charge sensing, in which the potential defect information obtained by the visual inspection system is combined with the potential defect information obtained by the electronic sensing system to produce a defect report. One or more high-resolution visual cameras are scanned over a stationary plate, and the image data from the camera(s) is processed to detect potential defects. A high-resolution electronic sensing system examines the stationary plate, and the image data from the sensor(s) is processed to detect potential defects. The potential defects from the visual image data and electronic sensing image data are processed to produce the final defect information.