The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2008
Filed:
Oct. 04, 2004
Leroy Dean Chapman, Saskatoon, CA;
Leroy Dean Chapman, Saskatoon, CA;
Illinois Institute of Technology, Chicago, IL (US);
Abstract
A method for detecting an enhanced image of an object by independently analyzing, detecting, digitizing, and combining images acquired on a high and a low angle side of a rocking curve of a crystal analyzer. An x-ray beam generated by a line x-ray source is collimated by a crystal monochromator including two non-matching crystals to form an x-ray area beam. The x-ray area beam is transmitted through an object to be imaged and onto an image detector and the image is digitized. The digitized images are simultaneously solved, preferably on a pixel-by-pixel basis, to derive an enhanced image which has dramatically improved contrast and spatial resolution over an image acquired through conventional radiology methods.