The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2008
Filed:
Aug. 22, 2005
Yoshinori Kuroiwa, Kamagaya, JP;
Hisashi Okugawa, Yokosuka, JP;
Yoshinori Kuroiwa, Kamagaya, JP;
Hisashi Okugawa, Yokosuka, JP;
Nikon Corporation, Tokyo, JP;
Abstract
An object is to provide a spectroscope and a spectrum laser microscope capable of carrying out sensitivity correction of a multi-channel photodetector with real time. The spectrum laser microscopeincludes a laser microscopeand a spectral analyzerhaving a multi-channel photodetectorcomposed of a plurality of photodetectorsfor detecting spectral distribution of the light from the laser microscope. Sensitivity fluctuation of the plurality of photodetectorsis calculated from a first luminance data detected before shifting relative position between the spectra and the multi-channel photodetectorand a second luminance data detected after shifting. Then, the first luminance data or the second luminance data is corrected.