The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2008

Filed:

Oct. 18, 2002
Applicants:

Kaoru Katayama, Yokohama, JP;

Toru Ishikura, Yokohama, JP;

Hiroyuki Fukuchi, Yokohama, JP;

Inventors:

Kaoru Katayama, Yokohama, JP;

Toru Ishikura, Yokohama, JP;

Hiroyuki Fukuchi, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method and apparatus for producing a reference image (template) used in a glass bottle inspecting apparatus for detecting a defect at a specific location of a bottle-mouth portion and the like of a glass bottle, and used for being compared with the image obtained from the glass bottle to be inspected in the inspecting apparatus. According to a method of producing a reference image of the present invention, plural images are formed by using a CCD camera to image a plurality of glass bottles as samples which may contain defective glass bottles, and a reference image is provided from the obtained plural images, a range of brightness when light is applied to a non-defective glass bottle being specified in said reference image.


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