The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2008

Filed:

Mar. 23, 2007
Applicants:

Shinya Takenouchi, Otsu, JP;

Hoshibumi Ichiyanagi, Nara, JP;

Yasuhiro Satoh, Otsu, JP;

Inventors:

Shinya Takenouchi, Otsu, JP;

Hoshibumi Ichiyanagi, Nara, JP;

Yasuhiro Satoh, Otsu, JP;

Assignee:

Omron Corporation, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/32 (2006.01); G01S 13/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring apparatus for measuring a distance from an object to be measured has, a transmitting means for alternately modulating amplitudes of a first continuous wave having a first frequency and a second continuous wave having a second frequency for transmitting a transmission signal as a carrier wave using an AM signal. The AM signal is produced by an AM producing circuit for modulating the amplitudes. The transmission signal is reflected as a reflection signal by the object to be measured and received by a receiving circuit. A first distance calculating circuit calculates the distance using a phase difference between the first and second continuous waves. A second distance calculating circuit is used for demodulating the receipt signal, detecting a phase difference, and calculating a distance from the object to be measured using the detected phase difference. A determining circuit determines a final distance measurement based on the above calculations.


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