The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2008
Filed:
Feb. 09, 2006
Jörg Frankenberger, Markt Schwaben, DE;
Robert Fasbender, Ottobrunn, DE;
Clemens Herrmann, München, DE;
Johan Lamotte, Rotselaar, BE;
Stephan Mair, Weilheim, DE;
Horst Scherer, Unterhaching, DE;
Jörg Frankenberger, Markt Schwaben, DE;
Robert Fasbender, Ottobrunn, DE;
Clemens Herrmann, München, DE;
Johan Lamotte, Rotselaar, BE;
Stephan Mair, Weilheim, DE;
Horst Scherer, Unterhaching, DE;
Agfa-Gevaert Healthcare GmbH, Leverkusen, DE;
Abstract
In order to improve the picture quality of X-rays, a read-out control is provided for controlling a read-out device such that a first storage phosphor layer, which has a first thickness d, is read out by the read-out device controlled in a first read-out mode, and a second storage phosphor layer, which has a second thickness dwhich is greater than the first thickness d, is read out by the read-out device controlled in a second read-out mode, the second read-out mode being different from the first read-out mode. The scan parameters of the read-out device set in the first read-out mode are different from the scan parameters set in the second read-out mode in at least one scan parameter. The scan parameters are, for example, the size of the pixels, a pulse duration and/or intensity and/or width of a focus range of stimulation light, integration time and/or feed time of the detector.