The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2008

Filed:

Mar. 03, 2006
Applicants:

Allan S. Myerson, Chicago, IL (US);

Alfred Y. Lee, Chicago, IL (US);

Inventors:

Allan S. Myerson, Chicago, IL (US);

Alfred Y. Lee, Chicago, IL (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/368 (2006.01); C30B 7/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for producing crystals and for screening crystallization conditions of chemical materials on distinct metallic islands with specific functional groups by using multi-functional substrates comprising a plurality of self-assembled monolayers having at least two different functionalities, for preparing and screening conditions necessary to promote specific polymorphs of a crystal, and a means for testing and screening the more precise conditions suitable for achieving desired sizes or forms of a crystal.


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