The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2008
Filed:
Nov. 10, 2004
Applicants:
Allan S. Myerson, Chicago, IL (US);
Alfred Y. Lee, Chicago, IL (US);
Inventors:
Allan S. Myerson, Chicago, IL (US);
Alfred Y. Lee, Chicago, IL (US);
Assignee:
Illinois Institute of Technology, Chicago, IL (US);
Primary Examiner:
Int. Cl.
CPC ...
C30B 7/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for producing crystals and for screening crystallization conditions of chemical materials on distinct metallic islands with specific functional groups, for preparing and screening the conditions necessary to promote a specific polymorph of a crystal, and a means for testing and screening the more precise conditions suitable for achieving a desired size or form of a crystal.
Myerson, Allan. (2008). Method for producing crystals and screening crystallization conditions (U.S. Patent No. 7329319). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7329319
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile