The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2008
Filed:
Jul. 02, 2003
Applicant:
Young-sun Chun, Gyeonggi-do, KR;
Inventor:
Young-sun Chun, Gyeonggi-do, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-Si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of and an apparatus for measuring image alignment errors for image formation includes printing two test marks separated from each other by a designated error distance on a printing medium on which images are printed, sensing the two test marks, measuring instants of time when the two test marks are sensed, and detecting an actual error distance of the two test marks using the measured instants of time and a moving speed of a carriage.
Quick Actions:
Chun, Young-sun. (2008). Method of apparatus for measuring image alignment errors for image formation in image forming apparatus (U.S. Patent No. 7328959). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7328959
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile