The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2008
Filed:
Sep. 16, 2005
Jeffry Neil Sundermeyer, Dunlap, IL (US);
Nitin R. Patel, Peoria, IL (US);
Ryan Paul Allgaier, East Peoria, IL (US);
Don Sit, Peoria, IL (US);
Timothy Allen Vik, Sparland, IL (US);
Jeffrey Dale Baskett, Peoria, IL (US);
Hiroko Kyuba, Peoria, IL (US);
Daniel Kimsey Dunn, Iii, Dunlap, IL (US);
Byron Edwin Truax, Dunlap, IL (US);
Burton Roland Clarke, Cuba, IL (US);
Jeffry Neil Sundermeyer, Dunlap, IL (US);
Nitin R. Patel, Peoria, IL (US);
Ryan Paul Allgaier, East Peoria, IL (US);
Don Sit, Peoria, IL (US);
Timothy Allen Vik, Sparland, IL (US);
Jeffrey Dale Baskett, Peoria, IL (US);
Hiroko Kyuba, Peoria, IL (US);
Daniel Kimsey Dunn, III, Dunlap, IL (US);
Byron Edwin Truax, Dunlap, IL (US);
Burton Roland Clarke, Cuba, IL (US);
Caterpillar Inc., Peoria, IL (US);
Abstract
A method and method of estimating fatigue life of a structure is disclosed. In one embodiment, the method may include determining strain on the structure using a plurality of gauges positioned on the structure. The method may also include detecting a parameter of the structure with a plurality of sensors positioned on the structure. Further, the method includes converting the detected parameter and the determined strain to proportional loads acting on the structure and transforming the proportional loads to coordinate system data associated with the structure. Based on the coordinate system data, the fatigue life of the structure may be estimated.