The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2008
Filed:
May. 17, 2006
Applicants:
Lisa M. Overstreet, Clearwater, FL (US);
Robert H. Fall, St. Petersburg, FL (US);
Inventors:
Lisa M. Overstreet, Clearwater, FL (US);
Robert H. Fall, St. Petersburg, FL (US);
Assignee:
Honeywell International Inc., Morristown, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for producing inertial measurement data is provided. The method comprises receiving raw inertial measurement data from one or more inertial sensors; receiving raw position data based on signals from a global navigation satellite system; processing the raw inertial measurement data and the raw position data with a filter to generate state variable estimates; and calculating enhanced inertial measurement data based on the raw inertial measurement data and the state variable estimates from the filter.