The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2008

Filed:

Jan. 31, 2007
Applicants:

Michael Gessner, Akron, OH (US);

Robert Roberts, South Euclid, OH (US);

Thomas Bertosa, Chardon, OH (US);

Hamid Namaky, South Russell, OH (US);

Inventors:

Michael Gessner, Akron, OH (US);

Robert Roberts, South Euclid, OH (US);

Thomas Bertosa, Chardon, OH (US);

Hamid Namaky, South Russell, OH (US);

Assignee:

SPX Corporation, Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A diagnostic tool and method are provided wherein the diagnostic tool can function as an inspection tool and a scan tool. The diagnostic tool determines if it is authorized for an inspection and then functions as an inspection tool and does not allow the scan tool function until the inspection is completed or voided. A software of the diagnostic tool includes a shared code, an inspection tool mode and a scan tool mode. The scan tool code and the inspection code are not shared so that updating of one code does not affect the code of the other.


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