The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2008
Filed:
Nov. 14, 2003
Atsuhiro Sakurai, Ibaraki, JP;
Yoshihide Iwata, Ibaraki, JP;
Atsuhiro Sakurai, Ibaraki, JP;
Yoshihide Iwata, Ibaraki, JP;
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A time-domain time-scale modification method based on the synchronous overlap-and-add method consists of a generalization of the envelope-matching time-scale modification method. The cross-correlation function employs n most significant bits rather than merely the sign bit of the prior envelope matching method. This provides higher accuracy for n>1. A fixed-size cross-correlation buffer is employed to eliminate the need for normalization inside the search loop. This invention makes full use of fast/parallel shift and multiply-and-accumulate (MAC) instructions of current digital signal processors to become at the same time faster and more precise than envelope-matching time-domain time-scale modification.