The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2008

Filed:

Oct. 19, 2005
Applicants:

David Piede, Allentown, PA (US);

Kalpendu Shastri, Orefield, PA (US);

Robert Keith Montgomery, Easton, PA (US);

Prakash Gothoskar, Allentown, PA (US);

Vipulkumar Patel, Breinigsville, PA (US);

Mary Nadeau, Alburtis, PA (US);

Inventors:

David Piede, Allentown, PA (US);

Kalpendu Shastri, Orefield, PA (US);

Robert Keith Montgomery, Easton, PA (US);

Prakash Gothoskar, Allentown, PA (US);

Vipulkumar Patel, Breinigsville, PA (US);

Mary Nadeau, Alburtis, PA (US);

Assignee:

SiOptical, Inc., Allentown, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/12 (2006.01); G02B 6/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An improvement in the reliability and lifetime of SOI-based opto-electronic systems is provided through the use of a monolithic opto-electronic feedback arrangement that monitors one or more optical signals within the opto-electronic system and provides an electrical feedback signal to adjust the operation parameters of selected optical devices. For example, input signal coupling orientation may be controlled. Alternatively, the operation of an optical modulator, switch, filter, or attenuator may be under closed-loop feedback control by virtue of the inventive monolithic feedback arrangement. The feedback arrangement may also include a calibration/look-up table, coupled to the control electronics, to provide the baseline signals used to analyze the system's performance.


Find Patent Forward Citations

Loading…