The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2008

Filed:

Feb. 03, 2006
Applicants:

Christian Simon, Laval, CA;

Djamel Meddah, Montreal, CA;

Inventors:

Christian Simon, Laval, CA;

Djamel Meddah, Montreal, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of pattern matching for recognition of objects within an image, uses a model defined by a set of one or more model primitives representative of large scale structures of an archetype. The image is analyzed to derive at least one target primitive representative of a large scale structure of the image. A basis is derived from at least one of the target primitives, and each of the target primitives represented as invariants in the derived basis. For each target primitive, any model primitives that at least partially match the target primitive are identified. Each identified model primitive is then processed to calculate a figure of merit indicative of a degree of correspondence between the target primitive and the model primitive. In some embodiments, the figure of merit is an Orthogonal projection between the target and model primitives, which is and accumulated for each model basis.


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