The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2008
Filed:
Jun. 30, 2003
Ajay Divakaran, Burlington, MA (US);
Ziyou Xiong, Urbana, IL (US);
Regunathan Radhakrishnan, Arlington, MA (US);
Kadir A. Peker, Winchester, MA (US);
Koji Miyahara, Newton, MA (US);
Ajay Divakaran, Burlington, MA (US);
Ziyou Xiong, Urbana, IL (US);
Regunathan Radhakrishnan, Arlington, MA (US);
Kadir A. Peker, Winchester, MA (US);
Koji Miyahara, Newton, MA (US);
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Abstract
A method detects short term, unusual events in a video. First, features are extracted features from the audio and the video portions of the video. Segments of the video are labeled according to the features. A global sliding window is applied to the labeled segments to determine global characteristics over time, while a local sliding window is applied only to the labeled segments of the global sliding window to determine local characteristic over time. The local window is substantially shorter in time than the global window. A distance between the global and local characteristic is measured to determine occurrences of the unusual short time events.