The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2008

Filed:

Nov. 25, 2003
Applicants:

David Matthew Deaven, Delafield, WI (US);

Girish Kumar Muralidharan, Pewaukee, WI (US);

Inventors:

David Matthew Deaven, Delafield, WI (US);

Girish Kumar Muralidharan, Pewaukee, WI (US);

Assignee:

GE Medical Systems, Inc., Waukesha, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique is provided for collaboratively processing and/or analyzing a set of image data. The technique provides for the initiation of a collaborative session by an application server. One or more collaborative workstations may join the collaborative session, providing common access to an image data set and to tools for processing and/or viewing the image data set. Operators at the collaborative workstations and/or the application server may thereby simultaneously access, process, and/or analyze the image data set. Communication between the operators via the network supporting the collaborative session may also be provided.


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