The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2008

Filed:

Sep. 30, 2002
Applicants:

Minako Kato, Kanagawa, JP;

Takatoshi Ohta, Kanagawa, JP;

Toshinori Igari, Tokyo, JP;

Inventors:

Minako Kato, Kanagawa, JP;

Takatoshi Ohta, Kanagawa, JP;

Toshinori Igari, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/52 (2006.01); H04N 1/56 (2006.01); G06K 15/00 (2006.01); G06K 9/00 (2006.01); G03F 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

For M (magenta) and C (cyan), in a case of generating, e.g., ternary data of Cto Cand Mto Mrespectively by using a look-up table on the basis of an error diffusion method, in a highlight portion of input M and C data (to which errors Ce and Me have been added respectively), a conversion space of correlating these data is used, while in a high-density portion, a conversion space equivalent to ordinary error diffusion is used. Thus, in a case of converting multivalued color image data into data of a lesser number of bits than the number of bits of color components constituting the multivalued color image data, it is possible to maintain excellent tonality on the entire image, and particularly to control graininess by preventing image quality deterioration in the highlight area.


Find Patent Forward Citations

Loading…