The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2008

Filed:

Apr. 10, 2006
Applicant:

Yang-chang Chien, Tu-Cheng, TW;

Inventor:

Yang-Chang Chien, Tu-Cheng, TW;

Assignee:

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring displacement of an object () having a flat surface (), includes the following steps. When the object is in a first position (A), a first laser beam is emitted onto the flat surface at a first incident angle, the first laser beam thereby is reflected by the flat surface and incident onto a light sensitive transducer () at a first incident location () at a second incident angle. The object is then moved to a second position (B), second laser beam is emitted onto the flat surface at the first incident angle, the second laser is reflected by the flat surface and incident onto the light sensitive transducer at a second incident location (') at the second incident angle. Lastly the displacement (D) of the object is calculated according to a distance (L) between the first and second incident location.


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