The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2008

Filed:

Jan. 10, 2002
Applicant:

Ernst Markart, Munich, DE;

Inventor:

Ernst Markart, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/01 (2006.01); G01N 31/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a test field system, including a test strip with a test field, and a measuring device having a test strip receiver for measuring the test field. The test strip receiver inducing a support surface for the test strip and positioners for holding the test strip inserted in the strip receiver so that a section of the test strip containing the test field is held in a definite position relative to the support surface. The strip receiver having two holding members spaced from one another on edge areas of the support surface for holding fast associated edges of the test strip substantially adjacent the support surface, the support surface in a middle area between the holding means is vertically displaced from the edge areas such that the test field of a test strip inserted in the test strip receiver is spaced apart from the support surface.


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