The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2008

Filed:

Dec. 03, 2004
Applicants:

Hyun Sang Chung, Suwon-shi, KR;

Young Suk Park, Bucheon-shi, KR;

Inventors:

Hyun Sang Chung, Suwon-shi, KR;

Young Suk Park, Bucheon-shi, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01); G02F 1/1333 (2006.01); G02F 1/1337 (2006.01); G02F 1/1343 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for fabricating an LCD device includes forming an alignment layer and an overcoat layer substantially simultaneously. The method includes, coating a mixture of an alignment layer material and an overcoat layer material on a substrate and at least partially separating the overcoat layer material and the alignment layer material by the curing the mixture.


Find Patent Forward Citations

Chung, Hyun. (2008). Method of forming an alignment layer and an overcoat layer in a stack structure on a substrate of a liquid crystal display by separating a mixture of an alignment layer material from an overcoat layer material in a thermal curing treatment (U.S. Patent No. 7327425). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7327425

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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