The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2008

Filed:

Mar. 24, 2005
Applicants:

Izhak Baharav, Palo Alto, CA (US);

Robert C. Taber, Palo Alto, CA (US);

Gregory S. Lee, Mountain View, CA (US);

Inventors:

Izhak Baharav, Palo Alto, CA (US);

Robert C. Taber, Palo Alto, CA (US);

Gregory S. Lee, Mountain View, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/00 (2006.01); H01Q 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microwave imaging system captures a microwave image of a target and minimizes noise in the microwave image using phase differentiation. A reflector antenna array is provided including a plurality of antenna elements for reflecting microwave radiation towards the target and for reflecting microwave radiation reflected from the target towards a microwave receiver. A processor programs the antenna elements with respective first phase shifts to capture a first microwave image of the target, and programs the antenna elements with respective second phase shifts to capture a second microwave image of the target. The first phase shift of each antenna element is 180 degrees different than the second phase shift for that antenna element. The processor minimizes noise from a combination of the first microwave image and the second microwave image.


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