The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2008
Filed:
Jun. 29, 2005
Applicants:
Myron J. Schneider, Ft. Collins, CO (US);
Eddie Williamson, Ft. Collins, CO (US);
Inventors:
Myron J. Schneider, Ft. Collins, CO (US);
Eddie Williamson, Ft. Collins, CO (US);
Assignee:
Agilent Technologies, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G01R 27/26 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
Capacitive leadframe testing techniques are improved through knowledge of characteristics of semiconductor junctions specific to nodes of device under test (DUT) that are connected to nodes under test of the DUT.
Schneider, Myron. (2008). Method for using internal semiconductor junctions to aid in non-contact testing (U.S. Patent No. 7327148). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7327148
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile