The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2008
Filed:
Oct. 23, 2006
Applicants:
Youngkyoo Jung, Madison, WI (US);
Yogesh Arvind Jashnani, Richmond, VA (US);
Walter F. Block, Madison, WI (US);
Inventors:
Youngkyoo Jung, Madison, WI (US);
Yogesh Arvind Jashnani, Richmond, VA (US);
Walter F. Block, Madison, WI (US);
Assignee:
Wisconsin Alumni Research Foundation, Madison, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A calibration procedure is performed prior to an off-axis MR scan to measure the MRI system timing errors in applying a frequency modulation waveform to the system receiver. Phase errors which otherwise occur when performing non-Cartesian scans are either prospectively reduced by offsetting the timing error or retrospectively offset by applying phase corrections to the acquired image data.