The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2008
Filed:
Sep. 26, 2006
Akio Atsuta, Kanagawa-ken, JP;
Masahiko Igaki, Kanagawa-ken, JP;
Akio Atsuta, Kanagawa-ken, JP;
Masahiko Igaki, Kanagawa-ken, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A main scale of an optical displacement measuring apparatus has slits arranged on it at regular intervals, a part of which is a missing slit that does not allow light to pass through used for detecting the original point. An index scale has four sets of windows formed on it. The four windows are arranged with mutual phase differences of ¼ P, where P is the pitch of the arrangement of the slits. When a part of the missing slit overlaps with the index scale, no light reaches to photodiodes from the missing slit and only a partial light flux passes through a window, so that the light quantity decreases. An original point signal associated with the missing slit can be obtained by adding up the outputs of all the photodiodes.