The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2008
Filed:
Feb. 25, 2004
Applicants:
Mark A. Larson, Round Rock, TX (US);
Lowell B. Dennis, Pflugerville, TX (US);
Inventors:
Mark A. Larson, Round Rock, TX (US);
Lowell B. Dennis, Pflugerville, TX (US);
Assignee:
Dell Products L.P., Round Rock, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Memory testing at system startup, such as boot POST, of an information handling system is accelerated by adjusting memory testing routines to use instructions that take advantage of optimizations made to information handling system and CPU architectures. For instance, memory test iterations in one Mbyte portions using 128-bit SIMD registers, 64-bit MMX registers, ADD and SUB instructions, the MOVNTDQ instruction, and relying on an initial setting of the gate Aand protected mode result in a substantially accelerated memory test.