The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2008

Filed:

Jul. 09, 2004
Applicants:

Eun-a Choi, Daejon, KR;

Nae-soo Kim, Daejon, KR;

Ji-won Jung, Busan, KR;

Sung-jun Cho, Busan, KR;

Tae-gil Lee, Busan, KR;

Sang-jin Park, Busan, KR;

In-ki Lee, Busan, KR;

Inventors:

Eun-A Choi, Daejon, KR;

Nae-Soo Kim, Daejon, KR;

Ji-Won Jung, Busan, KR;

Sung-Jun Cho, Busan, KR;

Tae-Gil Lee, Busan, KR;

Sang-Jin Park, Busan, KR;

In-Ki Lee, Busan, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a pre-processing apparatus using nonuniform quantization of a channel reliability value and a low density parity check (LDPC) decoding system. The pre-processing apparatus can present degradation in performance and be embodied simply by performing decoding pre-process by estimating a discrete channel reliability value (L*) through nonuniform quantization of a channel reliability value based on a relations between a bit error rate (BER) estimated through a simulation performed in advance and a standard deviation (σ) of channel noise within a predetermined range of noise estimation error and p, and bit-shifting a receiving signal as much as a discrete channel reliability value. The pre-processing apparatus includes: a channel reliability measuring unit, a nonuniform quantizing unit, a sign bit adding unit, a bit shifting unit.


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