The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7324913 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 29, 2008

Filed:

Feb. 01, 2006
Applicants:

Scott Douglas Clark, Rochester, MN (US);

Dorothy Marie Thelen, Rochester, MN (US);

Inventors:

Scott Douglas Clark, Rochester, MN (US);

Dorothy Marie Thelen, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a first aspect, a first method of testing a link between a first chip and a second chip is provided. The first method includes the steps of, while operating in a test mode, (1) transmitting test data of sufficient length to enable exercising of worst case transitions from the first chip to the second chip via the link; and (2) performing cyclic redundancy checking (CRC) on the test data to test the link. Numerous other aspects are provided.


Find Patent Forward Citations

Clark, Scott. (2008). Methods and apparatus for testing a link between chips (U.S. Patent No. 7324913). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7324913

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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