The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2008
Filed:
Dec. 21, 2005
Stanley L. Floyd, Enumclaw, WA (US);
Chih-lin Huang, Bellevue, WA (US);
Mark A. Stanish, Seattle, WA (US);
John E. Jones, Iii, Seattle, WA (US);
Susan Kaluzny, Seattle, WA (US);
David C. Slaughter, Davis, CA (US);
Tom J. Taylor, Seattle, WA (US);
Stanley L. Floyd, Enumclaw, WA (US);
Chih-Lin Huang, Bellevue, WA (US);
Mark A. Stanish, Seattle, WA (US);
John E. Jones, III, Seattle, WA (US);
Susan Kaluzny, Seattle, WA (US);
David C. Slaughter, Davis, CA (US);
Tom J. Taylor, Seattle, WA (US);
Weyerhauser Company, Federal Way, WA (US);
Abstract
Systems and methods are provided for detecting the potential of a wood sample, such as a board, to stay on grade, i.e., resist warp, after it is put into service and/or its moisture has re-equilibrated with the surrounding environment. The systems and methods include various sensor technologies and subjection of obtained data to various models, algorithms, and/or other mathematical formulas.