The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2008
Filed:
Oct. 06, 2005
Masahito Tanaka, Okayama, JP;
Yosuke Iwai, Okayama, JP;
Ikuo Nanno, Okayama, JP;
Takaaki Yamada, Okayama, JP;
Toshiro Miyachi, Yokohama, JP;
Masahito Tanaka, Okayama, JP;
Yosuke Iwai, Okayama, JP;
Ikuo Nanno, Okayama, JP;
Takaaki Yamada, Okayama, JP;
Toshiro Miyachi, Yokohama, JP;
OMRON Corporation, Kyoto, JP;
Abstract
In a method of controlling the temperature of a target object by measuring to obtain detected temperatures at a plurality of measurement positions and controlling a processing device such as a heater such that each detected temperature will match the corresponding one of target temperatures set for the processing device, a preliminary step is taken to determine the degrees of interference at the measurement positions by varying the target temperatures and the degrees of interference thus determined are used to correct the set target temperatures or the detected temperatures.