The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2008

Filed:

Apr. 20, 2004
Applicants:

Kotoko Morikawa, Tokyo, JP;

Akira Hagiwara, Tokyo, JP;

Inventors:

Kotoko Morikawa, Tokyo, JP;

Akira Hagiwara, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computed tomography (CT) imaging system for improving the image quality of a tomographic image at a predefined image production position in a subject's axis direction in tomographic image reconstruction by axial scanning. The CT system includes an X-ray tube and a detector array configured to conduct a plurality of scans for detecting X-rays passing through a region to be examined around an axis AX of the region to be examined at different positions along the subject's axis Ax direction; and for each of the plurality of scans, and a reconstructing section configured to calculate and reconstruct data for tomographic images of the region to be examined at a position corresponding to a detector row in the axis direction based on detected data acquired in that scan, and combine the data for the plurality of reconstructed tomographic images to generate data for a combined tomographic image at the position corresponding to the detector row.


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