The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2008

Filed:

Oct. 30, 2003
Applicants:

Tae-hyeun Ha, Seoul, KR;

Jae-seok Kim, Gyeonggi-do, KR;

Seong-joo Lee, Seoul, KR;

Inventors:

Tae-hyeun Ha, Seoul, KR;

Jae-seok Kim, Gyeonggi-do, KR;

Seong-joo Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An orthogonal frequency division multiplexing (OFDM)-based synchronization detection apparatus including a 2level quantizing unit quantizing received data samples into levels of 2, where n is an integer greater than or equal to zero (0), and a delaying unit delaying the data samples quantized through the 2level quantizing unit by a predetermined number of clocks and outputting data indicative thereof. A shifting unit shifts the output data samples of the 2level quantizing unit by an amount corresponding to an exponent of the output data of the delaying unit and a peak detecting unit detects a peak value from sums of outputs from the shifting unit.


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