The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7324398 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 29, 2008

Filed:

Sep. 27, 2005
Applicants:

Jae-eung Shim, Seoul, KR;

Jung-yong Choi, Gyeonggi-do, KR;

Young-gu Kang, Gyeonggi-do, KR;

Min-gyu Hwang, Seoul, KR;

Inventors:

Jae-Eung Shim, Seoul, KR;

Jung-Yong Choi, Gyeonggi-do, KR;

Young-Gu Kang, Gyeonggi-do, KR;

Min-Gyu Hwang, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.


Find Patent Forward Citations

Shim, Jae-Eung. (2008). Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same (U.S. Patent No. 7324398). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7324398

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