The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2008

Filed:

May. 12, 2003
Applicants:

Joerg Stierle, Waldenbuch, DE;

Peter Wolf, Leinfelden-Echterdingen, DE;

Gunter Flinspach, Leonberg, DE;

Inventors:

Joerg Stierle, Waldenbuch, DE;

Peter Wolf, Leinfelden-Echterdingen, DE;

Gunter Flinspach, Leonberg, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01B 27/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a device () for distance measurement, with at least one transmitting branch () with a transmission source () for a measurement signal for emitting a modulated measuring beam () in the direction of a target object (), and with a receive branch () for the measurement radiation () returning from the target object (), and with a control and evaluation unit () for determining the distance of the device () to the target object () from the measurement radiation returning from the target object (). It is proposed according to the invention that the device () include means that enable measurement of distances with predetermined measurement uncertainties. The present invention further relates to a method for distance measurement, with which a measurement of distances with predetermined measurement uncertainties is possible. To ensure a distance measurement in a certain, predetermined measurement time, the value on which a distance measurement is based can be adjusted to the measurement uncertainty, and can be increased incrementally in particular.


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