The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2008
Filed:
May. 03, 2005
Guenter Herrmann, Guetersloh, DE;
Frank Hilbk-kortenbruck, Warendorf, DE;
Guenter Herrmann, Guetersloh, DE;
Frank Hilbk-Kortenbruck, Warendorf, DE;
Claas Fertigungstechnik GmbH, Beelen, DE;
Abstract
A method is disclosed for measuring components () using a measurement system () guided by a manipulator (). In this process, reference features () are decentrally located at various positions near a component () to be measured, the reference features each being assigned to at least one measuring object () located at a close distance to the particular reference feature () on the component () to be measured. Before a test object () is measured, the measuring system () is first brought into a calibration position using the manipulator (), and the reference feature () assigned to the particular test object () is measured using the measuring system () to calibrate a coordinate system of the manipulator (). Using the manipulator (), the measuring system () is then moved into a measurement position, where the relevant test object () is measured. A corresponding device for measuring components and a component carrier () are also disclosed.