The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2008
Filed:
Dec. 10, 2004
Ronald D. Hartman, Odessa, FL (US);
Douglas A. Chamberlin, Trinity, FL (US);
Kim R. Heinicka, Seminole, FL (US);
John Koss, Fort Worth, TX (US);
Bryan Williams, Novi, MI (US);
Brandon Noska, Austin, TX (US);
Ronald D. Hartman, Odessa, FL (US);
Douglas A. Chamberlin, Trinity, FL (US);
Kim R. Heinicka, Seminole, FL (US);
John Koss, Fort Worth, TX (US);
Bryan Williams, Novi, MI (US);
Brandon Noska, Austin, TX (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
A system to determine unwanted noise produced by simulation equipment. In one embodiment, an angular rotation noise measuring system comprises a stable body, a laser, at least one interferometer and at least one mirror. The laser is adapted to generate a primary laser beam and is mounted to the stable body. The at least one interferometer is adapted to split the primary laser beam into two or more out of phase secondary laser beams. Moreover, the interferometer is coupled to the stable body. The at least one mirror is coupled to a fixture on a vibration generating device. The fixture is adapted to hold a device under test. Each mirror is adapted to reflect an associated secondary laser beam back to the interferometer such that an interference pattern is formed with the secondary laser beams. Changes to the interference pattern determine the angular rotation noise caused by the vibration generating device.