The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2008
Filed:
Aug. 25, 2004
Guenter Spahlinger, Stuttgart, DE;
Guenter Spahlinger, Stuttgart, DE;
LITEF GmbH, Freiburg, DE;
Abstract
A method for determination of/compensation for the bias/random walk errors induced by the light source in fiber-optic Sagnac interferometers employing a modulation method for stochastically independent shifting of the operating point to the points of highest sensitivity. A reference beam is output from the light beam emitted from the light source of the interferometer and passed to the fiber coil to produce a proportional reference intensity signal. Such signal is demodulated with the demodulation pattern of the rotation rate control loop to demodulate the rotation rate intensity signal (proportional to rotation rate). The demodulated reference intensity signal measures the bias/random walk errors to be determined. Demodulation of the reference intensity signal is simultaneous with that of the rotation rate intensity signal so that components of the reference and rotation rate intensity signals (each resulting from light components simultaneously emitted from the light source) are identically demodulated.