The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2008

Filed:

Apr. 12, 2004
Applicants:

John Erik Lindholm, Saratoga, CA (US);

Harold Robert Feldman Zatz, Palo Alto, CA (US);

Christian Rouet, San Rafael, CA (US);

Rui M. Bastos, Santa Clara, CA (US);

Inventors:

John Erik Lindholm, Saratoga, CA (US);

Harold Robert Feldman Zatz, Palo Alto, CA (US);

Christian Rouet, San Rafael, CA (US);

Rui M. Bastos, Santa Clara, CA (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/00 (2006.01); G06T 1/20 (2006.01); G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for processing divergent samples in a programmable graphics processing unit is described. In one embodiment, the method includes the step of incrementing a subroutine depth of a first sample to designate that first call instructions are to be executed on the first sample. The method also includes the steps of pushing state data of a second sample upon which the first call instructions are not to be executed onto a global stack and executing the first call instructions on the first sample.


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