The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2008

Filed:

Feb. 20, 2004
Applicants:

Qun Feng (Fred) Liao, San Jose, CA (US);

Zhou (Mike) Hong, Cupertino, CA (US);

Inventors:

Qun Feng (Fred) Liao, San Jose, CA (US);

Zhou (Mike) Hong, Cupertino, CA (US);

Assignee:

Via Technologies, Inc., Hsien-Tien, Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of performing anisotropic texture mip-mapping. The method includes determining a region of support for a set of target pixels of the image to be textured, and mapping the region of support to an area in texture map that is generally elliptical. For each axis of the ellipse the number of samples is determined and a filter function is performed on those samples to find the final color value. For four texels, the filter function is a weighted sum of the color values of each texel, where the weights are determined based on the fraction of the Level of Detail (LOD) and the fraction of the U or V coordinate.


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