The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2008
Filed:
Nov. 30, 2005
Aki Yamazaki, Tokyo, JP;
Aki Yamazaki, Tokyo, JP;
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
The present invention is intended to provide a phase error measuring method capable of measuring a phase error occurring in each phase encoding direction that corresponds to the direction of a readout magnetic field gradient which is turned in units of a radian. The phase error measuring method in accordance with the present invention is implemented in a magnetic resonance imaging (MRI) apparatus that performs a K-space filling scan to define data in a K-space having readout lines formed along a Kx axis, a Ky axis, and a mixed axis of them. The phase error measuring method includes a plurality of phase error measurement steps of measuring a phase error that occurs in each phase encoding direction corresponding to the direction of a readout magnetic field gradient which is turned in units of a radian.